|
序号
|
元器件名称
|
元器件制造商
|
元器件说明
|
PDF资料下载
|
产品购买
|
|
1
|
SN74ABT8646DLG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 28-SSOP
|
|
产品购买
|
|
2
|
SN74BCT8245ADWG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 24SOIC
|
|
产品购买
|
|
3
|
SN74BCT8245ADWE4
|
Texas Instruments
|
IC SCAN TEST DEVICE TXRX 24-SOIC
|
|
产品购买
|
|
4
|
SN74BCT8245ADW
|
Texas Instruments
|
IC SCAN TEST DEVICE TXRX 24-SOIC
|
|
产品购买
|
|
5
|
SN74ABT8996PW
|
Texas Instruments
|
IC ADDRESSABLE SCAN PORT 24TSSOP
|
|
产品购买
|
|
6
|
CLVT8996DWG4
|
Texas Instruments
|
IC 10-BIT SCAN PORT XCVR 24-SOIC
|
|
产品购买
|
|
7
|
SN74BCT8374ADWG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 24SOIC
|
|
产品购买
|
|
8
|
SN74BCT8374ADWE4
|
Texas Instruments
|
IC SCAN TEST DEVICE W/FF 24-SOIC
|
|
产品购买
|
|
9
|
SN74BCT8373ADWG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 24SOIC
|
|
产品购买
|
|
10
|
SN74BCT8240ADWG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 24SOIC
|
|
产品购买
|
|
11
|
SN74BCT8373ADWE4
|
Texas Instruments
|
IC SCAN TEST DEVICE LATCH 24SOIC
|
|
产品购买
|
|
12
|
SN74BCT8373ADW
|
Texas Instruments
|
IC SCAN TEST DEVICE LATCH 24SOIC
|
|
产品购买
|
|
13
|
SN74BCT8240ADWE4
|
Texas Instruments
|
IC SCAN TEST DEVICE BUFF 24-SOIC
|
|
产品购买
|
|
14
|
74LVTH182502APMG4
|
Texas Instruments
|
IC 18BIT UNIV BUS TXRX 64-LQFP
|
|
产品购买
|
|
15
|
SN74LVTH18504APMG4
|
Texas Instruments
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
|
产品购买
|
|
16
|
SN74LVTH18502APMG4
|
Texas Instruments
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
|
产品购买
|
|
17
|
SN74S283NE4
|
Texas Instruments
|
IC 4BIT BINARY FULL ADDER 16-DIP
|
|
产品购买
|
|
18
|
74ABTE16245DLRG4
|
Texas Instruments
|
IC BUS TRANSCVR 16BIT 48SSOP
|
|
产品购买
|
|
19
|
SN74ABTE16245DLR
|
Texas Instruments
|
IC 16BIT I-WS BUS TXRX 48-SSOP
|
|
产品购买
|
|
20
|
SN74ABT8952DWRG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 28SOIC
|
|
产品购买
|